Tim Gough serves as a Senior Principal Test Engineer at Frontgrade Technologies, where he leverages his extensive experience in the semiconductor and electronic manufacturing industry to drive innovation in ATE (Automated Test Equipment) testing solutions. With a robust background in high-speed digital, storage, mixed-signal, and...
Tim Gough serves as a Senior Principal Test Engineer at Frontgrade Technologies, where he leverages his extensive experience in the semiconductor and electronic manufacturing industry to drive innovation in ATE (Automated Test Equipment) testing solutions. With a robust background in high-speed digital, storage, mixed-signal, and memory device testing, Tim is instrumental in developing sophisticated test and characterization solutions tailored for high-reliability digital and mixed-signal products. His expertise encompasses a wide range of ATE systems, including the SPEA DOT800, Teradyne Tiger, TEV AX2820, Advantest 93k, and SPEA, enabling him to effectively address the unique challenges presented by advanced technologies, such as stacked memories and 3.125 GHz SerDes.
In his current role, Tim is not only focused on hardware and software development but also on the debugging and implementation processes at both the wafer and package levels. His hands-on approach ensures that test solutions are not only efficient but also reliable, meeting the stringent quality standards required in the industry. Tim’s proficiency in test automation and electronics hardware design further enhances his ability to streamline testing processes, reduce time-to-market, and improve overall product performance.
With a strong educational foundation and a commitment to continuous improvement, Tim Gough exemplifies the qualities of a forward-thinking engineer dedicated to advancing the capabilities of ATE testing in the ever-evolving landscape of semiconductor technology. His contributions at Frontgrade Technologies not only bolster the company's reputation for excellence but also pave the way for future innovations in the field.
