Chris Shearer is a seasoned Metrologist at HP, where he plays a pivotal role in advancing the company's dimensional metrology capabilities. As the site expert utilizing the Mycrona Primus CMM, Chris is at the forefront of ensuring precision and quality in the manufacturing process. His...
Chris Shearer is a seasoned Metrologist at HP, where he plays a pivotal role in advancing the company's dimensional metrology capabilities. As the site expert utilizing the Mycrona Primus CMM, Chris is at the forefront of ensuring precision and quality in the manufacturing process. His expertise in Geometric Dimensioning and Tolerancing (GD&T) allows him to effectively collaborate with design engineers, providing critical insights on blueprints and CAD drawings. This collaboration not only enhances product design but also streamlines the manufacturing workflow, ensuring that HP's consumer electronics meet the highest standards of quality.
In his current role, Chris is deeply involved in key projects that leverage his skills in statistical data analysis and process engineering. He is adept at programming to datum structures and creating tailored fixture setups that optimize measurement accuracy. His proficiency in quality management and troubleshooting enables him to identify and resolve potential issues before they escalate, thereby maintaining the integrity of production processes.
Chris’s technical documentation skills further enhance his contributions, as he effectively communicates complex metrology concepts through clear and concise documentation. His ability to lead cross-functional teams, combined with his Six Sigma training, positions him as a valuable asset in driving continuous improvement initiatives within HP. With a strong foundation in manufacturing and technical supervision, Chris Shearer exemplifies the intersection of precision engineering and innovative design, making significant strides in the information technology and services industry.
